Software app development to determine optical constants in non-homogeneous semiconductor thin films
Article Sidebar
Main Article Content
In this work, we designed and developed a useful software tool for studying the optical properties of semiconductor materials, which makes it possible to know if the deposited non-homogeneous semiconductor thin films are suitable for the fabrication of semiconductor devices. By means of this algorithm, based on Swanepoel's methods, it is possible to estimate optical constants of non-homogeneous semiconductor films such as: absorption coefficient (α), refractive index (n) and band gap (Eg). In addition, it is possible to estimate the thickness variation of films. The input information for this tool corresponds to the spectral transmittance curves from experimental procedures. The proposed tool was found to offer high accuracy and therefore, it can be used to study the properties of semiconductor thin films used in the manufacture of semiconductor devices such as solar cells.
Mónica A. Botero Londoño, Universidad Industrial de Santander, Escuela de Ingenierías Eléctrica, Electrónica y de Telecomunicaciones, Bucaramanga, Colombia.
https://orcid.org/0000-0003-1706-3182
Deisy Y. Torres Celis, Universidad Industrial de Santander, Escuela de Ingenierías Eléctrica, Electrónica y de Telecomunicaciones, Bucaramanga, Colombia.
https://orcid.org/0000-0001-9123-2269
Erik A Africano-Mejía, Universidad Industrial de Santander, Escuela de Ingenierías Eléctrica, Electrónica y de Telecomunicaciones, Bucaramanga, Colombia.
https://orcid.org/0000-0002-3370-0156
Clara L Calderón-Triana, Universidad Nacional de Colombia, Departamento de Física, Bogotá, Colombia.
https://orcid.org/0000-0002-3149-2939
Alexander Sepúlveda- Sepúlveda, Universidad Nacional de Colombia, Departamento de Física, Bogotá, Colombia.
https://orcid.org/0000-0002-9643-5193
(1) REN21. 2021. Renewables 2021 Global Status Report (Paris: REN21 Secretariat). [Internet]. gsr 2021 full report en; [citado 12 octubre 2021]. Disponible en: https://www.ren21.net/reports/globalstatus-report/
(2) Poelman D, Philippe F. Methods for the determination of the optical constants of thin films from single transmission measurements: a critical review. J Phys D Appl Phys. 2003; 36(15): 1850-57. DOI: 10.1088/0022-3727/36/15/316
(3) Swanepoel R. Determination of the thickness and optical constants of amorphous silicon. J Phys E. 1983; 16(12): 1214-22. DOI: 10.1088/0022- 3735/16/12/023
(4) Swanepoel R. Determination of surface roughness and optical constants of inhomogeneous amorphous silicon films. J Phys E. 1984; 17(10): 896-903. DOI: 10.1088/0022-3735/17/10/023
(5) Vargas-Perea H, Rocha-González R, Botero-Londoño M, Sepúlveda-Sepúlveda A, Calderón-Triana C. Herramienta de software para determinar constantes ópticas en celdas solares tipo película delgada. Dyna (Medellín). 2018; 85(206): 321-28. DOI: 10.15446/dyna.v85n206.70003
(6) GANJOO, A y GOLOVCHAK, R. Computer program PARAV for calculating optical constants of thin films and bulk materials: Case study of amorphous semiconductors. En: Journal of Optoelectronics and Advanced Materials. Junio, 2008, vol. 10, Nro. 6. p. 1328-1332.
(7) CARICATO, A. P; FAZZI, A y LEGGIERI, G. A computer program for determination of thin films thickness and optical constants. En: Applied Surface Science. Julio, 2005, vol. 248, Nro. 1-4. p. 440-445.
(8) Moreno-Montoya L, Arango P. Caracterización estructural y morfológica de películas de ZnO crecidas sobre sustratos de vidrio. Dyna (Medellín). 2007; 74(151): 37- 45.
(9) Vallejo Lozada W. Desarrollo de materiales fotovoltaicos usados como ventana óptica en celdas solares [tesis doctoral en Internet]. Bogotá D C: Universidad Nacional de Colombia; 2011 [citada 12 mar 2021]. 75 p. Disponible en: https://repositorio.unal.edu.co/handle/unal/7 728
(10) Yu PY, Cardona M, Fundamentals of Semiconductors: Physics and Materials Properties [Internet]. 4 a ed. New York: Springer; 2010 [citado 16 mar 2021]. 775 p. Disponible en: http://dx.doi.org/10.1007/978-3-642-00710- 1
(11) Caricato AP, Fazzi A, Leggieri G. A computer program for determination of thin films thickness and optical constants. Appl Surf Sci. 2005; 248(1-4): 440-45. DOI: 10.1016/j.apsusc.2005.03.069
(12) National Renewable Energy Laboratory (NREL) [Internet]. Golden (Colorado): NREL; c2018. efficiency chart; [citado 18 mar 2021]. Disponible en: https://www.nrel.gov/pv/assets/images/effic iency-chart.png
(13) Aly S, Ahmed-Akl A. Influence of film thickness on optical absorption and energy gap of thermally evaporated CdS0.1Se0.9 thin films. Chalcogenide Lett. 2015; 12(10): 489- 96.
Accepted 2021-11-13
Published 2022-05-26
This work is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License.
Authors grant the journal and Universidad del Valle the economic rights over accepted manuscripts, but may make any reuse they deem appropriate for professional, educational, academic or scientific reasons, in accordance with the terms of the license granted by the journal to all its articles.
Articles will be published under the Creative Commons 4.0 BY-NC-SA licence (Attribution-NonCommercial-ShareAlike).